Lists of instruments

Home >> List of instruments

Electron microscopes, AFM	NMR / ESR
Analyzers for elements, surfaces,structural	Mass spectrometers
Chromatographs	Atomic absorption spectrometers / ICP
Spectroscopic analyzers	Particle size distribution analyzers
Nitrogen/phosphorus analyzers	Total organic carbon analyzers

If you do not find any instruments that you want to use in this list, please also refer to Technical Support Center at Tohoku University.

Instruments	Model	Section
FE-TEM	Hitachi, HF-2000	Fine structure analysis
FE-TEM/STEM	JEOL, JEM-2100F	Fine structure analysis
LOW-TEM	Hitachi, HT-7500	Fine structure analysis
TEM	JEOL, NEOARMex	Satellite 1
TEM	JEOL, JEM-2100 (HR)	Satellite 1
TEM	JEOL, JEM-2100 (HC)	Satellite 1
FE-STEM	Hitachi High-Technologies, HD-2700	Satellite 2
FE-SEM	JEOL, JSM-6500F	Fine structure analysis
FE-SEM/EBSP	JEOL, JSM-7100F	Fine structure analysis
FE-SEM	JEOL, JSM-7800F	Satellite 1
FE-SEM	JEOL, JXA-8530F	Satellite 1
FE-SEM	JEOL, JSM-IT800(SHL)	Satellite 1
FE-SEM	Hitachi High-Technologies, S-4800	Satellite 2
Tabletop SEM	Hitachi High-Technologies, TM3000	Satellite 2
AFM/SPM	SII Nanocute	Fine structure analysis
Focused Ion Beam Scanning Electron Microscope	JEOL, JIB-4600F	Satellite 1
Focused Ion Beam Scanning Electron Microscope	JEOL, JIB-PS500i	Satellite 1
FIB sample finishing equipment	Fischione Nanomill 1040	Satellite 1
Sample processing apparatus for electron microscope	Various devices	Fine structure analysis
Ion milling	Gatan PIPSⅡ cool Model695	Satellite 1

Instruments	Model	Section
CHNSO Elemental Analyzer	Elementar,vario EL cube	Trace analysis
Wavelength Dispersive XRF	Bruker AXS, S8 Tiger	Trace analysis
Energy dispersive XRF	HORIBA, XGT-5000	Satellite 1
XPS	Thermo Fisher Scientific, Theta Probe	Satellite 1
XPS	Shimadzu, AXIS-ULTRA	Satellite 2
EPMA	JEOL, JXA-8530F	Satellite 1
EPMA	Shimadzu, EPMA-1720HT	Satellite 2
AES (Auger Electron Spectrometer)	ULVAC-PHI, PHI 710	Satellite 1
AES (Auger Electron Spectrometer)	JEOL,JAMP-9510F	Satellite 1
GD-OES	HORIBA JOBIN YVON, GD-Profiler 2	Fine structure analysis
GD-OES	HORIBA JOBIN YVON, GD-Profiler 2	Satellite 1
SC-XRD	Bruker, D8 QUEST	Satellite 2

Instruments	Model	Section
Mass spectrometer	JEOL, JMS-700	Trace analysis
GC-MS1	Agilent 6890N, 5975C	Trace analysis
GC-MS2	Agilent 8890, 5977C	Trace analysis
ICP-MS	Agilent 8800	Trace analysis
High resolution MS	AB Sciex TripleTOF 5600+	Trace analysis
Mass spectrometer for proteome analysis	Thermo Fisher Scientific, Q Exactive Plus	Satellite 2

Instruments	Model	Section
GC	Shimadzu, GC-2010	Trace analysis
GC-MS1	Agilent 6890N, 5975C	Trace analysis
GC-MS2	Agilent 8890, 5977C	Trace analysis
HPLC	Agilent 1290 InfinityⅡ LC system	Trace analysis
Ion chromatograph	Thermo Fisher Scientific Integrion	Satellite 3
Ion chromatograph	Metrohm, Basic IC plus 883	Trace analysis

Instruments	Model	Section
Atomic absorption spectrometer	ThermoFisher, iCE3500	Satellite 2
ICP-AES	ThermoFisher, iCAP6500	Satellite 2
ICP-MS	Agilent, 8800	Trace analysis

Instruments	Model	Section
Particle size distribution analyzer	Malvern, MASTERSIZER 3000	Satellite 3

Instruments	Model	Section
Nitrogen/phosphorus analyzer	BLTEC, Auto Analyzer II	Satellite 3
Nitrogen/phosphorus analyzer by form	BLTEC, QuAAtro 2HR	Satellite 3

Instruments	Model	Section
Total organic carbon analyzer	Shimadzu, TOC-L	Satellite 3